NAME

       struct nvme_st_result - Self-test Result

SYNOPSIS

       struct nvme_st_result {
           __u8 dsts;
           __u8 seg;
           __u8 vdi;
           __u8 rsvd;
           __le64 poh;
           __le32 nsid;
           __le64 flba;
           __u8 sct;
           __u8 sc;
           __u8 vs[2];
        };

Members

       dsts        Device Self-test Status: Indicates the device self-test code and the status of
                   the operation (see enum nvme_status_result and enum nvme_st_code).

       seg         Segment Number: Iindicates  the  segment  number  where  the  first  self-test
                   failure   occurred.   If   Device  Self-test  Status  (dsts)  is  not  set  to
                   #NVME_ST_RESULT_KNOWN_SEG_FAIL, then this field should be ignored.

       vdi         Valid Diagnostic Information: Indicates  the  diagnostic  failure  information
                   that is reported. See enum nvme_st_valid_diag_info.

       rsvd        Reserved

       poh         Power  On  Hours (POH): Indicates the number of power-on hours at the time the
                   device self-test operation was completed or aborted.  This  does  not  include
                   time that the controller was powered and in a low power state condition.

       nsid        Namespace  Identifier  (NSID):  Indicates  the  namespace that the Failing LBA
                   occurred    on.     Valid     only     when     the     NSID     Valid     bit
                   (#NVME_ST_VALID_DIAG_INFO_NSID)  is  set  in  the Valid Diagnostic Information
                   (vdi) field.

       flba        Failing LBA: indicates the LBA of the logical block that caused  the  test  to
                   fail.  If the device encountered more than one failed logical block during the
                   test, then this field only indicates one of those failed logical blocks. Valid
                   only  when  the  NSID  Valid bit (#NVME_ST_VALID_DIAG_INFO_FLBA) is set in the
                   Valid Diagnostic Information (vdi) field.

       sct         Status Code Type: This field may contain  additional  information  related  to
                   errors  or conditions. Bits 2:0 may contain additional information relating to
                   errors or conditions that  occurred  during  the  device  self-test  operation
                   represented  in  the  same  format  used  in the Status Code Type field of the
                   completion queue entry (refer to enum nvme_status_field).  Valid only when the
                   NSID  Valid  bit (#NVME_ST_VALID_DIAG_INFO_SCT) is set in the Valid Diagnostic
                   Information (vdi) field.

       sc          Status Code: This field may contain additional information relating to  errors
                   or  conditions that occurred during the device self-test operation represented
                   in the same format used in the Status  Code  field  of  the  completion  queue
                   entry.  Valid only when the SCT Valid bit (#NVME_ST_VALID_DIAG_INFO_SC) is set
                   in the Valid Diagnostic Information (vdi) field.

       vs          Vendor Specific.