NAME

       struct nvme_self_test_log - Device Self-test (Log Identifier 06h)

SYNOPSIS

       struct nvme_self_test_log {
           __u8 current_operation;
           __u8 completion;
           __u8 rsvd[2];
           struct nvme_st_result   result[NVME_LOG_ST_MAX_RESULTS];
        };

Members

       current_operation
                   Current Device Self-Test Operation: indicates the status of the current device
                   self-test operation. If a device self-test operation is in process (i.e., this
                   field is set to #NVME_ST_CURR_OP_SHORT or #NVME_ST_CURR_OP_EXTENDED), then the
                   controller shall not set this field to  #NVME_ST_CURR_OP_NOT_RUNNING  until  a
                   new  Self-test  Result  Data Structure is created (i.e., if a device self-test
                   operation completes or is aborted, then the controller shall  create  a  Self-
                   test    Result    Data    Structure   prior   to   setting   this   field   to
                   #NVME_ST_CURR_OP_NOT_RUNNING).  See enum nvme_st_curr_op.

       completion  Current Device Self-Test Completion: indicates the percentage  of  the  device
                   self-test  operation  that is complete (e.g., a value of 25 indicates that 25%
                   of the device self-test operation is complete and 75% remains to  be  tested).
                   If  the  current_operation  field  is  cleared to #NVME_ST_CURR_OP_NOT_RUNNING
                   (indicating there is no device self-test operation  in  progress),  then  this
                   field is ignored.

       rsvd        Reserved

       result      Self-test Result Data Structures, see struct nvme_st_result.