plucky (2) nvme_self_test_log.2.gz

NAME

       struct nvme_self_test_log - Device Self-test (Log Identifier 06h)

SYNOPSIS

       struct nvme_self_test_log {
           __u8 current_operation;
           __u8 completion;
           __u8 rsvd[2];
           struct nvme_st_result   result[NVME_LOG_ST_MAX_RESULTS];
        };

Members

       current_operation
                   Current  Device  Self-Test  Operation:  indicates  the status of the current device self-test
                   operation. If a device self-test operation  is  in  process  (i.e.,  this  field  is  set  to
                   #NVME_ST_CURR_OP_SHORT  or #NVME_ST_CURR_OP_EXTENDED), then the controller shall not set this
                   field to #NVME_ST_CURR_OP_NOT_RUNNING until a new Self-test Result Data Structure is  created
                   (i.e.,  if  a  device  self-test operation completes or is aborted, then the controller shall
                   create   a   Self-test   Result   Data   Structure   prior   to   setting   this   field   to
                   #NVME_ST_CURR_OP_NOT_RUNNING).  See enum nvme_st_curr_op.

       completion  Current  Device  Self-Test  Completion:  indicates  the  percentage  of  the device self-test
                   operation that is complete (e.g., a value of 25 indicates that 25% of  the  device  self-test
                   operation  is  complete  and  75%  remains  to be tested).  If the current_operation field is
                   cleared to #NVME_ST_CURR_OP_NOT_RUNNING (indicating there is no device self-test operation in
                   progress), then this field is ignored.

       rsvd        Reserved

       result      Self-test Result Data Structures, see struct nvme_st_result.